半导体专业名司缩写表.docx
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半导体专业名司缩写表.docx
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半导体专业名司缩写表
A/D
analogtodigital
AA
atomicabsorption
AAS
atomicabsorptionspectroscopy
ABC
activity-basedcosting
ABM
activity-basedmanagement
AC
alternatingcurrent;activatedcarbon
ACF
anisotropicconductivefilm
ACI
after-cleaninspection
ACP
anisotropicconductivepaste
ACT
alternativecontroltechniques;actualcycletime
ADC
analog-to-digitalconverter
ADE
advanceddevelopmentenvironment
ADI
after-developinspection
ADT
applieddiagnostictechnique
ADTSEM
Apply/DevelopTrackSpecificEquipmentModel
AE
atomicemission;acousticemission;absoluteellipsometry
AEC
advancedequipmentcontroller
AECS
AdvancedEquipmentControlSystem;AutomatedEquipmentControlSystem
AEI
after-etchinspection;automatedequipmentinterface
AEM
analyticalelectronmicroscopy
AES
Augeremission/electronspectroscopy
AFM
atomicforcemicroscopy
AFP
abrasive-freepolish
Ag
silver
A-GEMTF
AdvancedGEMTaskForce
AGV
automatedguidedvehicle
AHF
anhydroushydrogenfluoride
AHU
airhandlingunit
AIR
automatedimageretrieval
Al
aluminum
ALD
atomiclayerdeposition
ALE
atomiclayerepitaxy;applicationlogicelement
ALS
advancedlightsource;advancedlow-powerSchottky
AMC
airbornemolecularcontamination
AMHS
automatedmaterialhandlingsystem
AMT
advancedmanufacturingtechnology
AMU
atomicmassunit
ANN
artificialneuralnetwork
ANOVA
analysisofvariance
AOV
air-operatedvalve
AP
adhesionpromoter
APA
advancedperformancealgorithm
APC
advancedprocesscontrol
APCD
add-onpollutioncontroldevice
APCFI
AdvancedProcessControlFrameworkInitiative
APCVD
atmosphericpressurechemicalvapordeposition
APEC
advancedprocessequipmentcontrol
API
applicationprogramminginterface;atmosphericpressureionization
APM
atmosphericpassivationmodule;acousticplatemode
APRDL
AdvancedProductsResearchandDevelopmentLaboratory
aPSM
attenuatingphase-shiftmask
AQI
ACCESSqueryinterface
AQL
acceptablequalitylevel
Ar
argon
AR
aspectratio
ARAMS
AutomatedReliability
ARC
antireflectivecoating
ARDE
aspectratio-dependentetching
ARPA
AdvancedResearchProjectsAgency(seeDARPA)
ARS
angle-resolvedscattering
As
arsenic
AS/RS
automatedstorageandretrievalsystem
ASAP
AdvancedStepperApplicationProgram
ASIC
application-specificintegratedcircuit
ASO
automaticshutoff
ASP
advancedstripandpassivation;advancedstripprocessor
ASR
automatedsendreceive
ATDF
AdvancedToolDevelopmentFacility
ATE
automatictestequipment
ATG
automatictestgeneration
ATLAS
abbreviatedtestlanguageforallsystems
atm
atmosphere
ATP
advancedtechnologyprogram;adenosinetriphosphate;acceptanceandtoolperformance
ATR
attenuatedtotalreflectance
Att
attenuated
Au
gold
AVP
advancedverticalprocessor
AVS
advancedvisualizationsystem
AWE
asymptoticwaveformevaluation
AWISPM
abovewaferinsituparticlemonitoring
AWS
advancedwetstation
B
billion;boron
Ba
barium
BARC
bottomantireflectivecoating
BASE
BostonAreaSemiconductorEducation(Council)
BAW
bulkacousticwave
BC
biascontrast
BDEV
behavior-leveldeviation
BDS
BrownianDynamicsSimulation
Be
beryllium
BEOL
backendofline
BESOI
bondedandetchbacksilicononinsulator
BF
brightfield
BFGS
Broyden-Fletcher-Goldfarb-Shannooptimizationalgorithm
BFL
bufferedfield-effecttransistorlogic
BGA
ballgridarray
BHT
Brinellhardnesstest
Bi
bismuth
BiCMOS
bipolarcomplementarymetal-oxidesemiconductor
BIFET
bipolarfield-effecttransistor
BIM
binaryintensitymask
BiMOS
bipolarmetal-oxidesemiconductor
BIST
built-inself-test
BIT
bulkiontemperature
BITE
built-intestequipment
BMC
bubblememorycontroller
BMD
bulkmicrodefect
BOE
bufferedoxideetchant
BOR
bottomofrange
BOSS
BookofSEMIStandards;binaryobjectstoragesystem
BOX
buriedoxide
BPR
beamprofilereflectometry;businessprocessreengineering
BPSG
boronphosphosilicateglass
BPTEOS
BPSGfromaTEOSsource
Br
bromine
BSE
backscatteredelectrondetection
BTAB
bumpedtapeautomatedbonding
BV
breakdownvoltage
C
carbon
Ca
calcium
CA
CIMarchitecture
CAA
CIMapplicationsarchitecture
CAB
CompetitiveAnalysisBenchmarking
CAD
computer-aideddesign
CADT
controlapplicationdevelopmenttool
CAE
computer-aidedengineering
CAI
computer-assistedinstruction
CAM
computer-aidedmanufacturing
CAPS
computer-assistedproblemsolving
CAR
chemicallyamplifiedresist
CARRI
ComputerizedAssessmentofRelativeRiskImpacts
CASE
computer-aidedsoftwareengineering;computer-aidedsystemsengineering
CAT
computer-aidedtesting
CAW
ConstructionAnalysisWorkgroup
CAWC
cryogenicaerosolwafercleaning
CBGA
ceramicballgridarray
CBS
chemicalbottlestoragearea
CBT
computer-basedtraining
CC
chipcarrier;clustercontroller
CCC
ceramicchipcarrier
CCD
charge-coupleddevice
CCSL
compatiblecurrent-sinkinglogic
CCW
counterclockwise
Cd
cadmium
CD
criticaldimension
CD/OL
criticaldimensionoverlay
CDA
cleandryair
CDE
chemicaldownstreametch
CDEM
CustomerDeliveryEnterpriseModel
CDI
collector-diffusionisolation
CDM
CommonDeviceModelforSAB
CDO
controlleddecomposition/oxidation
CDR
chemicaldistributionroom
CDS
chemicaldistributionsystem
Ce
cerium
CE
capillaryelectrophoresis
CEC
cellevaluationchip
CEE
controlexecutionenvironment
CEM
continuousemissionsmonitoring
CER-DIP
ceramicdualin-linepackage
CFA
componentfailureanalysis
CFC
chlorofluorocarbon
CFD
computationalfluiddynamics
CFM
contamination-freemanufacturing
CIC
cleanroominterfacechamber
CID
charge-injectiondevice
CIE
computer-integratedengineering
CIM
computer-integratedmanufacturing
CIM-OSA
computer-integratedmanufacturing-opensystemsarchitecture(ESPRITprogram)
CIP
ContinuousImprovementProgram
CIS
CenterforIntegratedSystems
CISC
complexinstructionsetcomputer
Cl
chlorine
CLCC
ceramicleadedchipcarrier
CLIC
closed-loopintensitycontrol
CM
configurationmanagement;cassettemodule
CMC
cassettemodulecontroller
CML
currentmodelogic
CMM
capabilitymaturitymodel
CMOS
complementarymetal-oxidesemiconductor
CMP
chemicalmechanicalplanarization
CMR
common-moderejectionratio;cancelmoverequest
CNC
computernumericalcontrol;condensationnucleuscounter
CNT
carbonnanotube
Co
cobalt
COB
chip-on-board
COC
costofconsumables
CODEC
coder-decoder
COED
computer-optimizedexperimentaldesign
COGS
costofgoodssold
CoO
costofownership
CORBA
commonobjectrequestbrokerarchitecture
CORE
compositeobjectreference
COSS
commonobjectservicesspecification
COT
customer-ownedtooling
CoV
coefficientofvariance
Cp
processcapability
CPD
concurrentproductdevelopment
CPE
Communications
CPGA
ceramicpingridarray
Cpk
processcapabilityindex
CQFP
ceramicquadflatpack
CQN
closed-queuingnetwork
Cr
chromium
CRC
cyclicredundancycheck
CRM
Cost/ResourceModel
Cs
cesium
CSA
CIMsystemsarchitecture
CSE
controlsystemsengineering
CSF
criticalsuccessfactor
CSL
current-steeringlogic
CSMA/CD
carrier-sense
CSP
chip-scalepackage
CSPED
concurrentsemiconductorproductionandequipmentdevelopment
CST
CIMsystemstechnology
CSTR
continuouslystirredtankreactor
CSV
comma-separatedvariable
CTC
clustertoolcontroller
CTE
coefficientofthermalexpansion
CTI
cycletimeimprovement
CTMC
clustertoolmodularcommunications
Cu
copper
CUB
centralutilitybuilding
CUBES
capacityutilizationbottleneckefficiencysystem
CUI
commonuserinterface
CUSUM
cumulativesum
CV
capacitance-to-voltage
CVCM
collectedvolatilecondensablematerials
CVD
chemicalvapordeposition
CW
continuouswave
Cz
Czochralskiprocess
D/A
digitaltoanalog
D/B
diebonding
DAC
digital-to-analogconverter
DAS
directabsorptionspectroscopy
DASSL
differentialalgebraicsystemsolver
DBMS
databasemanagementsystem
DC
directcurrent
DCA
directchipattachment
DCATS
double-containedacidtransfersystem
DCE
distributedcomputerenvironment
DCL
digitalcommandlanguage;displaycommunicationlog
DCS
dichlorosilane
DDL
devicedescriptionlanguage
DDMS
defectdatamanagementsystem
DEDS
discrete-eventdynamicsimulation
DES
dataencryptionstandard;displayequipmentstatus
DF
darkfield
DFC
densifiedfluidclean
DFE
dual-frequencyetch
DFM
designformanufacturing
DFR
designforreliability
DFT
designfortest
DFY
designforyield
DHF
dilutehydrofluoricacid
DI
deionized;dielectricisolation
DIBL
drain-inducedbarrierleakage
DIC
differentialinterferencecontrast
DIL
dualin-line
DIP
dualin-linepackage
DLBI
device-levelburn-in
DLOC
developedsourcelinesofcode
DLS
displaylotstatus
DLT
device-leveltest
DLTS
deep-leveltransientspectroscopy
DMA
directmemoryaccess;dynamicmechanicalanalysis
DMH
displaymessagehelps
DML
datamanipulationlanguage;displaymessagelog
DMM
digitalmultimeter
DMOS
diffusedmetal-oxidesemiconductor
DMR
displaymoverequests
DO
dynamicoptimization
DOA
dead-onalignment
DOAS
differentialopticalabsorptionspectroscopy
DOE
designofexperiments
DOF
depthoffocus
DOP
dioctylphthalate
DPA
destructivephysicalanalysis
DPM
digitalpanelmeter
DPP
discharge-producedplasma
DPSRAM
dual-portstaticrandomaccessmemory
DRAM
dynamicrandomaccessmemory
DRAPAC
DesignRuleandProcessArchitectureCouncil
DRC
designrulecheck
DRE
destructionremovalefficiency
DRIFTS
diffusereflectanceinfraredFouriertransformspectroscopy
DRT
defectreviewtool
DSA
displaysystemactivity;dimensionallystableanode
DSC
differentialscanningcalorimetry
DSMC
directsimulationMonteCarlo
DSQ
d
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