表面粗糙度计量资料.ppt
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表面粗糙度计量资料.ppt
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表面粗糙度计量,AMPLITUDEMODULATION,2000TaylorHobsonLtd,泰勒霍普森有限公司演示中心,AMPLITUDEMODULATION,目录,1.为什么要测量表面粗糙度?
2.测量方法,3.测量基准,4.表面再现,5.术语,6.滤波,7.参数,8.承载区域(材料比),9.Rk参数,10.形状测量,11.标定方法,12.ConicsandAspherics.,13.三维测量,14.DrawingIndication.,1.为什么要测量表面粗糙度?
AMPLITUDEMODULATION,表面的特性,材料的微观结构,表面的特性,材料的微观结构刀具的作用,表面的特性,材料的微观结构刀具的作用刀具在材料表面的不稳定,表面的特性,材料的微观结构刀具的作用刀具在材料表面的不稳定机床导轨的误差,表面的特性,材料的微观结构刀具的作用刀具在材料表面的不稳定机床导轨的误差工件表面由于压力而产生的变形,表面的特性,材料的微观结构刀具的作用刀具在材料表面的不稳定机床导轨的误差工件表面由于压力而产生的变形,在表面上有害的缺陷,深的谷易于导致裂纹的可能扩展当与其紧密配合的零件接触时,太多的峰将引起过早的磨损和失效过多的波纹将导致噪音或预示加工问题,在表面上需要的特性,当润滑非常重要时,表面上需有足够多的谷用于存储油表面上足够的的峰用于吸附油漆和粘结剂表面分布充足的谷可提高工件的可没锻(塑)性光滑的表面可减小噪音、振动或得到高的反射率,为什么需要测量表面粗糙度?
生产过程控制预测工件的表现监控零件的性能,为什么需要测量表面粗糙度?
理想的情况,为什么需要测量表面粗糙度?
实际情况生产过程控制,为什么需要测量表面粗糙度?
预测工件的表现,为什么需要测量表面粗糙度?
监控零件的性能,返回目录,2.测量方法,AMPLITUDEMODULATION,测量方法,接触式测量非接触式测量,如何测量表面粗糙度?
比对样板,接触式测量,测量方法,测量方向(X),测头摆动(Z),数据间隔(X),电感式传感器,测头,测杆,刀口支点,铁芯,线圈,线圈,测量方法,压电式传感器,测量方法,激光器,光电二极管,激光式传感器,测头,测杆,返回目录,更进一步的信息,测量方法,3.测量基准,AMPLITUDEMODULATION,导头基准,导头,测头移动(Z),测量方向(X),测量基准,使用导头基准的优点,降低振动的影响,不需要表面调平,仪器便携性,牢固的设计,测量基准,测头到导头间隔对测量的影响,实际高度,H1,H2,测量高度,测量基准,测头到导头间隔对测量的影响,测量结果P-V=0m,P-V=10m,测量基准,独立基准,驱动箱基准,测量方向,测量基准,独立基准,驱动箱基准,基准导头,光学平晶,测量基准,返回目录,4.表面再现,AMPLITUDEMODULATION,测头针尖几何形状,锥形测头,切去顶端的金字塔型测头,2m,表面再现,更多信息,测尖尺寸和形状的影响,表面再现,测尖侧面接触,表面再现,由测头测量的形状,测尖,B,B,A,A,测尖侧面接触,返回目录,表面再现,5.术语,AMPLITUDEMODULATION,数据点,术语,混淆,采样间隔,真实信号,信号混淆,更进一步信息,术语,粗糙度、波纹度和形状,采样表面,术语,粗糙度、波纹度和形状,形状,术语,粗糙度、波纹度和形状,波纹度,术语,粗糙度、波纹度和形状,粗糙度,返回目录,6.滤波,AMPLITUDEMODULATION,术语,滤波-区分粗糙度和波纹度,表面相互作用,用图形技术滤波,取样长度,滤波,滤波,形状,参数,取样长度,Ra,Rq,Rz等.,粗糙度滤波,滤波,形状,参数,取样长度,Wa,Wq,Wzetc.,波纹度滤波,电子和数字滤波器,ISO2CR滤波器2CRPC滤波器Gaussian高斯滤波器,滤波,ISO2CR滤波器,ISO2CR滤波后的图形,滤波,未滤波图形,更进一步的信息,ISO2CR滤波的效果,相对于滤波中线经修正后的图形,滤波,由滤波建立的中线,2CRPC滤波器,2CRPC滤波后的图形,滤波,未滤波图形,ISO2CRPC滤波器,滤波,由滤波建立的中线,相对于滤波中线经修正后的图形,高斯滤波器,未滤波图形,高斯滤波后的图形,滤波,高斯滤波器,图形滤波,滤波,更进一步的信息,滤波的效果,未滤波图形,波纹度幅值=100m,粗糙度波长=0.25mm,波纹度波长=8.0mm,粗糙度幅值=20m,滤波,2CR粗糙度滤波效果,8.0mm取样长度滤波,波纹度波长=8.0mm,滤波,2.5mm取样长度滤波,波纹度幅值=24m,粗糙度波长=0.25mm,波纹度波长=8.0mm,粗糙度幅值=20m,Filters,2CR粗糙度滤波效果,0.8mm取样长度滤波,波纹度幅值=2m,粗糙度幅值=20m,粗糙度波长=0.25mm,Filters,2CR粗糙度滤波效果,0.25mm取样长度滤波,波纹度幅值=0m,粗糙度幅值=15m,Filters,2CR粗糙度滤波效果,0.08mm取样长度滤波,波纹度幅值=0m,粗糙度幅值=4m,Filters,2CR粗糙度滤波效果,测量长度、评价长度和取样长度的关系(ISO2CR),取样长度(Cut-off),评价长度,测量长度,滤波,启动长度,停止长度,滤波类型,ISO2CR-第1、2个取样长度舍弃2CRPC-第1个和最后一个取样长度舍弃Gaussian-第1个半个和最后一个半个取样长度舍弃,滤波,取样长度的选取,滤波,取样长度的选取,滤波,0.25mm,取样长度(Cut-off),选择正确的取样长度值,1.25mm,滤波,取样长度的选取,除非图纸上另有要求,取样长度依照上表选取,滤波,带宽=Lc/Ls的比值,Ls,滤波,返回目录,Lc,7.参数,AMPLITUDEMODULATION,参数,分析类型,粗糙度-R前缀波纹度-W前缀未滤波-P前缀,参数,参数类型,幅值参数-Z轴方向,参数,幅值参数-Z轴方向间距参数-X轴方向,参数类型,参数,幅值参数-Z轴方向间距参数-X轴方向混合参数-X和Z轴,参数类型,参数,幅值参数-Ra,参数,幅值参数Ra的限制,Ra,参数,幅值参数Rq(RMS),lr=评价长度,参数,幅值参数Rt,ln=评价长度,lr=取样长度,参数,幅值参数Rp,评价长度,参数,幅值参数Rv,评价长度,参数,幅值参数Rz,Rz2,Rz3,Rz4,Rz5,Rz=(Rz1+Rz2+Rzn)/n,参数,幅值参数Rz1max,Rp1max和Rv1max,Rz1max,Rp1max,Rv1max,参数,间距参数HSC(高点计数),lr=取样长度(Cut-off),ln=评价长度,A=定义高度,B=中线,参数,间距参数HSC(高点计数),参数,间距参数Rpc(峰数),A=选择的带宽,B=中线,参数,间距参数Rpc(峰数),基底表面的峰将导致橙色油漆脱落,BaseSheetSteel,PaintedSurface,参数,间距参数Sm(平均宽度),lr=取样长度(Cut-off),MeanLine,参数,混合参数-Rdq(Pdq,Wdq)(坡度均方根),参数,EffectsofSurfaceSlopesonvibration&noise,NoVibration/Quiet,LowFrequencyRumble,HighFrequencyScream,混合参数-Rdq(Pdq,Wdq)(坡度均方根),参数,该参数值越小,表面的反射率越高,表面外观越好。
该参数值越大,表面的反射率越底,表面外观越差。
返回目录,混合参数-Rdq(Pdq,Wdq)(坡度均方根),8.承载区域(材料比),AMPLITUDEMODULATION,承载区域(材料比),混合参数-Rmr,上部的表面决定磨合特性,谷决定润滑特性,表面的基体部分决定磨损或寿命特性,混合参数-Rmr,研磨板,承载线,ln=评价长度,Rmr=a+b+c+d+ex100ln,承载区域(材料比),材料比率曲线(Rmr),0,100%,tp(%),p高度,在P高度时的Tp(%),承载区域(材料比),0,100%,tp(%),p高度,在P高度时的Tp(%),材料比率曲线(Rmr),承载区域(材料比),材料比率曲线(Rmr),0,p高度,在P高度时的Tp(%),tp(%),100%,承载区域(材料比),幅值分布曲线,0,p高度,峰的个数,承载区域(材料比),更进一步的信息,与材料比率曲线相关的参数-Rsk(非对称性),SurfacewithRandomAmplitudeDistribution-ZeroSkew,随机分布的表面-零非对称,承载区域(材料比),与材料比率曲线相关的参数-Rsk(非对称性),表面峰占多数-正非对称,承载区域(材料比),与材料比率曲线相关的参数-Rsk(非对称性),表面谷占多数-负非对称,承载区域(材料比),与材料比率曲线相关的参数-Rku(峭度),Rku3,Rku=3,Rku3,返回目录,承载区域(材料比),9.Rk参数,AMPLITUDEMODULATION,参数,Rk参数,表面交互作用,材料比率曲线(Rmr),0,100%,tp(%),承载区域(材料比),材料比率曲线,倾斜的图形,参数,中线,未滤波的图形,Rk参数,参数,中线,谷拟制后的未滤波图形,谷去除并保存在内存中,Rk参数,参数,最终的滤波之后的粗糙度曲线,Rk参数,参数,100%,0,tp(%),40%,Rk参数,参数,100%,0,tp(%),Rdc,40%,A,B,D,E,F,C,Rk参数,参数,C,100%,0,tp(%),Rdc,40%,A,B,D,E,F,Rk,D1,Mr2,Mr1,Rk参数,参数,tp(%),C,100%,0,Rdc,40%,A,B,D,E,F,Rk,D1,Mr2,Mr1,Area1,E,C,Rpk,Area2,E,D,Rvk,Rk参数,参数,100%,0,tp(%),40%,Rk,Mr2,Mr1,Rpk,Rvk,Rk参数,参数,Rk相关的参数,Rk-核心粗糙度深度,Rpk-峰高度,Rvk-谷高度,Mr1-峰的百分比,Mr2-谷的百分比,A1-峰的面积,A2-谷的面积,返回目录,10.形状测量,AMPLITUDEMODULATION,最小二乘直线,形状测量,形状测量,直线度(最小二乘直线),形状测量,直线度(最小区域直线),形状测量,最小二乘圆弧,R=最小二乘圆弧半径,r-r=最小二乘圆弧,r,r,形状测量,最小二乘圆弧半径测量,t=34.501656mm,r=110mm,l=80mm,t=弦高r=最小二乘半径l=测量长度/2,r-t,形状测量,最小二乘圆弧半径测量,t=1.833462mm,r=110mm,l=20mm,r-t,t=弦高r=最小二乘半径l=测量长度/2,形状测量,最小二乘圆弧半径测量,t=1.833962mm,r=109.9705mm,l=20mm,返回目录,t=弦高r=最小二乘半径l=测量长度/2,11.标定方法,AMPLITUDEMODULATION,标定方法,球标定,软件校正,弧形误差,dZ,dX,软件校正,测头针尖误差,测头针尖中心的轨迹,标定方法,Ra和Rz粗糙度样板,标定方法,Ra和Rz粗糙度样板,标定方法,测量方向,2.5m台阶高度,三线(台阶高度)标准,标定方法,三线(台阶高度)标准,A=中线,B=标定高度,标定方法,三线(台阶高度)标准,A=调平的表面,B=Pt,C=未调平的表面,返回目录,更进一步信息,Conics&Aspherics,AMPLITUDEMODULATION,ConicsandAspherics,ConicSections,ConicConstants,Ellipse:
K0,Sphere:
K=0,OblateEllipse:
K0,ConicsandAspherics,ConicConstants,Hyperbola:
K-1,Parabola:
K=-1,ConicsandAspherics,Z=(Ax)2,WhatisanAspheric?
ConventionalSphericalLens,ConicsandAspherics,WhatisanAspheric?
AsphericLens,ConicsandAspherics,ReasonsforusinganAspheric,ReducesSphericalAberration,AbilitytoProduceVari-focalLenses,ReductioninLensSizeandWeight,GreaterDesignFreedom,ConicsandAspherics,HowisanAsphereconstructed?
BasicConicSection(Sphere),ZAxis,XAxis,ConicsandAspherics,Z2+X2=1R2R2,HowisanAsphereconstructed?
AsphericPolynomialCurve,Z=a8|x|8,BasicConicSection(Sphere),ZAxis,XAxis,ConicsandAspherics,HowisanAsphereconstructed?
AsphericProfile,AsphericPolynomialCurve,BasicConicSection(Sphere),ZAxis,XAxis,A,B,C,ConicsandAspherics,HowisanAsphereconstructed?
AsphericProfile,AsphericPolynomialCurve,BasicConicSection(Sphere),ZAxis,XAxis,A,B,C,AsphericProfile,AsphericPolynomialCurves,BasicConicSection,ConicsandAspherics,StandardEquationforAnAsphericSurface,Where:
XistheRadialdistancefromtheAsphericAxis,Zisthecorrespondingverticaldistance,aistheindexedPolynomialCoefficient,CisthereciprocaloftheBaseRadius,KistheConicConstantoftheSurface,ConicsandAspherics,BaseRadiusofCurvature,ConicsandAspherics,HowDoWeMeasureanAsphericSurface?
OpticalFlat,AsphericAxis,ConicsandAspherics,HowDoWeAnalyseanAsphericSurface?
AsphericDataRadius=40.0mmK=-1A4=5.3188e-007A6=5.5231e-009A8=-1.6774e-011A10=-6.3352e-014,ConicsandAspherics,AsphericFormFit,XAxis,ZAxis,A,B,AsphericAxis,ConicsandAspherics,ResidualErrorafterAsphericFormRemoval,+ZAxis,-ZAxis,-XAxis,+XAxis,A,AsphericAxis,AsphericAxis,ConicsandAspherics,HowDoWeAnalyseanAsphericSurface?
ConicsandAspherics,AsphericParameters,ConicsandAspherics,Aspherics-FurtherAnalysis,ConvexComponent-ConcaveResidualFormError-IncreaseBaseRadius,ConicsandAspherics,ConvexComponent-ConvexResidualFormError-DecreaseBaseRadius,ConicsandAspherics,Aspherics-FurtherAnalysis,SmallestRtValueAchieved-TrueShape&BaseRadius,ConicsandAspherics,BacktoContentsPage,Aspherics-FurtherAnalysis,3D(Areal)Measurement,AMPLITUDEMODULATION,3DMeasurement,Advantagesof3D(Areal)over2D,GoodVisualisationoftheSurface,MoreStatisticallyStable,BetteratDetecting&AnalysingDefects,ManyMethodsofRepresentingtheData,3DMeasurement,Disadvantagesof3D(Areal),Longermeasurementcycles,MeasurementProducesLargeDataFiles,MainlyRestrictedtoR&D,SometimesVisuallySubjective,3DMeasurement,ContactMeasurementMethod,YAxisIncrementalMovement,3DMeasurement,Non-ContactMeasurementMethod,YAxisIncrementalMovement,MeasurementAxis(X),Laser,CCDDetector,3DMeasurement,CriticalDimensionsfor3DMeasurement,Profile1,Profile2,Z1,Z2,X,Z,Y,3DMeasurement,DataAnalysis,3DMeasurement,LevellingtheData,3DMeasurement,FormRemoval,CylinderLiner-NoFormRemoved,CylinderLiner-FormRemoved,3DMeasurement,Viewing3DData,MeshedAxonometricView,3DMeasurement,Viewing3DData,PhotoSimulationView,Pseudo-ColourView,3DMeasurement,Viewing3DData,ContinuousAxonometricView,ContourView,3DMeasurement,3DFiltering,0.8mm,0.8mm,0.8mmGaussianFilter,Cut-offLostTop,BottomLeft&Right,SamplingArea,3DMeasurement,3DParameterTypes,Amplitude,Spatial,Hybrid,Functional,3DMeasurement,3DAmplitudeParameters-Prefix:
S,Sa=arithmeticmeanofthedeviationsfromthemeanplane,Sq=RMSofthemeanofthedeviationsfromthemeanplane,St=totalpeaktovalleyoverthesamplearea,Sp=heightofthehighestpeaktomeanplane,Sv=depthofthedeepestvalleytomeanplane,3DMeasurement,3DSpatialParameters,SPc=peakcountbetweentwoselectableplanes,Sds=densityofsummitscontainedinasamplingarea,Std=texturedirectionofthesurface,3DMeasurement,3DHybridParameters,Sq=RMSslopeofthesurface,Ssc=meansummitcurvatureofthesurface,Sdr=developedinterfacialarearatioofthesurface,3DMeasurement,3DFunctionalParameters,Stp=surfacebearingarearatio,Sbi=surfacebearingindex,Sci=corefluidretentionindex,Svi=valleyfluidretentionindex,3DMeasurement,Volume/DefectAnalysis,3DMeasurement,StepHeightAnalysis,DrawingIndication,AMPLITUDEMODULATION,DrawingIndication,ConventionalSurfaceTextureSymbol,GraphicalSymbolsforSurfaceTexture,6.8,RequirementforSurfaceTexture,1,RequirementforSurfaceTexture,MaterialRemovalRequired,2,RequirementforSurfaceTexture,MaterialRemovalNotPermitted,3,GraphicalSymbolsforSurfaceTexture,DrawingIndication,GraphicalSymbolsforSurfaceTexture,DrawingIndication,(d),(e)3,(c)Turned,(a)0.0025-0.8/Rz6.8,(b)0.0025-0.8/Ra2.2,ClickHereforFurtherInformation,GraphicalSymbolsforSurfaceTexture,DrawingIndication,Fe/Ni15pcr,0.0025-0.8/Rz6.8,DrawingIndication,Bi-LateralTolerancing,GraphicalSymbolsforSurfaceTexture,URa0.9LRa0.3,DrawingIndication,The16%Rule(DefaultRule),Nomorethan16%ofthemeasuredvalue
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